Jump to content

Specific Process Knowledge/Characterization/Optical microscope: Difference between revisions

← Older editNewer edit →
VisualWikitext
Lgpe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701
353 edits
mNo edit summary
Lgpe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701
353 edits
No edit summary
Line 70: Line 70:
|Wollastron prism
|Wollastron prism
|Motorized stage
|Motorized stage
[[Specific_Process_Knowledge/Characterization/Optical microscope/Nikon Eclipse L200 auto scan guide|auto scan guide]]
|No
|No
|No
|No
Line 227: Line 229:




:: '''[[Specific_Process_Knowledge/Characterization/Optical microscope/Nikon Eclipse L200 auto scan guide]]'''
It is possible to make an automated scanning of a full wafer on the Nikon Eclipse L200 with motorized stage (located in D-3) '''[[Specific_Process_Knowledge/Characterization/Optical microscope/Nikon Eclipse L200 auto scan guide|Nikon Eclipse L200 auto scan guide]]'''
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/Optical_microscope"