Specific Process Knowledge/Wafer cleaning/RCA: Difference between revisions
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[[Image:RCA-bænk_RR2_0.JPG|300x300px|thumb|RCA bench: positioned in cleanroom B1. <br /> RCA1 - RCA2 - HF - BHF(pre-dep wafers)]] | [[Image:RCA-bænk_RR2_0.JPG|300x300px|thumb|RCA bench: positioned in cleanroom B1. <br /> RCA1 - RCA2 - HF - BHF(pre-dep wafers)]] | ||
The RCA clean is used for cleaning | The RCA clean is used for cleaning wafers before taking them into the furnaces and a few other equipments (check the cross contamination sheet). | ||
It consists of two solutions | It consists of two solutions (RCA1 and RCA2) and diluted HF. A crucial part of the RCA cleaning procedure is the oxidation by H<sub>2</sub>O<sub>2</sub> at elevated temperatures. Therefore, the lifetime of RCA1 and RCA2 solutions after preparation is limited because H<sub>2</sub>O<sub>2</sub> decomposes at 70<sup>o</sup>C. | ||
* | *RCA1 contains: H<sub>2</sub>O, NH<sub>4</sub>OH and H<sub>2</sub>O<sub>2</sub> (5:1:1). It is used for removal of light organics, particles and metals.<br> | ||
* | *RCA2 contains: H<sub>2</sub>O, HCl and H<sub>2</sub>O<sub>2</sub> (5:1:1). It is used for removal of alkalis, metal hydroxides, and residual metals.<br> | ||
You can find the APV [http:// | You can find the APV for the RCA bench [http://labmanager.dtu.dk/d4Show.php?id=1916&mach=243 here] | ||
===RCA procedure=== | ===RCA procedure=== | ||
*RCA1: 10 min | *'''RCA1: 10 min''' | ||
*DI water rinsing (dumping three times) | *DI water rinsing (dumping three times) | ||
*HF: 30 sec (you may avoid this step in case of a very thin oxide (0-200 Å) as the top layer) | *HF: 30 sec (you may avoid this step in case of a very thin oxide (0-200 Å) as the top layer) | ||
*DI water rinsing ( | *DI water rinsing (bubbler)<br> | ||
*RCA2: 10 min | *'''RCA2: 10 min''' | ||
*DI water rinsing (dumping three times) | *DI water rinsing (dumping three times) | ||
*Optional: HF: 30 sec (avoid it if you have a very thin oxide (0-200 Å) as the top layer) | *Optional: HF: 30 sec (avoid it if you have a very thin oxide (0-200 Å) as the top layer) | ||
*DI water rinsing ( | *DI water rinsing (bubbler)<br> | ||
For procedure details please look in the [http://labmanager.danchip.dtu.dk/d4Show.php?id=1633&mach=243 user manual] in LabManager. | For procedure details please look in the [http://labmanager.danchip.dtu.dk/d4Show.php?id=1633&mach=243 user manual] in LabManager. | ||
Revision as of 13:58, 7 August 2017
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RCA cleaning
The RCA clean is used for cleaning wafers before taking them into the furnaces and a few other equipments (check the cross contamination sheet). It consists of two solutions (RCA1 and RCA2) and diluted HF. A crucial part of the RCA cleaning procedure is the oxidation by H2O2 at elevated temperatures. Therefore, the lifetime of RCA1 and RCA2 solutions after preparation is limited because H2O2 decomposes at 70oC.
- RCA1 contains: H2O, NH4OH and H2O2 (5:1:1). It is used for removal of light organics, particles and metals.
- RCA2 contains: H2O, HCl and H2O2 (5:1:1). It is used for removal of alkalis, metal hydroxides, and residual metals.
You can find the APV for the RCA bench here
RCA procedure
- RCA1: 10 min
- DI water rinsing (dumping three times)
- HF: 30 sec (you may avoid this step in case of a very thin oxide (0-200 Å) as the top layer)
- DI water rinsing (bubbler)
- RCA2: 10 min
- DI water rinsing (dumping three times)
- Optional: HF: 30 sec (avoid it if you have a very thin oxide (0-200 Å) as the top layer)
- DI water rinsing (bubbler)
For procedure details please look in the user manual in LabManager.
The user manual, user APV and contact information can be found in LabManager: RCA info page in LabManager
Overview of RCA process data
RCA1 | RCA2 | HF | |
---|---|---|---|
General description |
Used for removal of light organics, particles and desorption of trace metals (Au, Ag, Ni, Cd, Zn, Co, Cr, etc). |
Used for removal of alkali ions, metal hydroxides (of Al, Fe, Mg, Zn) and residual trace metals (e.g. Cu and Au). |
Used for removal of oxide generated in RCA1 and RCA2 |
Chemical solution | H2O, NH4OH(25-29%) and H2O2(30%) (5:1:1) | H2O, HCl(37%) and H2O2(30%) (5:1:1) | 5% HF |
Process temperature | 70-80 oC | 70-80 oC | Room temperature |
Process time |
10 min. |
10 min. |
30 sec. |
Life time of the chemical solutions | Can only be heated one time. When hot: it lasts for ~1h | Can only be heated one time. When hot: it lasts for ~1h | ~2 months |
Allowed materials |
|
|
|
Batch size |
1-25 2",4" or 6" wafers at a time |
1-25 2",4" or 6" wafers at a time |
1-25 2",4" or 6" wafers at a time |
Size of substrate |
4"-6" wafers |
4"-6" wafers |
4"-6" wafers |