Specific Process Knowledge/Thin film deposition/Deposition of Silicon Nitride: Difference between revisions
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!Stoichiometry | !Stoichiometry | ||
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*Si<sub>3</sub>N<sub>4</sub> | *Stoichiometric nitride, Si<sub>3</sub>N<sub>4</sub> | ||
* | *Low stress/silicon rich nitride, SRN | ||
SRN | |||
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*Si<sub>x</sub>N<sub>y</sub>H<sub>z</sub> | *Si<sub>x</sub>N<sub>y</sub>H<sub>z</sub> | ||
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*1-25 100 mm wafers | *1-25 100 mm wafers | ||
*1-25 150 mm wafers (only 6" furnace) | *1-25 150 mm wafers (only 6" furnace) | ||
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*Several smaller samples | *Several smaller samples | ||