Specific Process Knowledge/Characterization/Probe station: Difference between revisions
Created page with "==Probe Station== '''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Pr..." |
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The wafer are pushed down on the four pins so a measurement is performed. It works only for 4" wafers because a special holder is need. | The wafer are pushed down on the four pins so a measurement is performed. It works only for 4" wafers because a special holder is need. | ||
[[Image: | [[Image:probestation.jpg|thumb|300x300px|Probe station: positioned in Service room CX1]] | ||
'''The user manual, technical information and contact information can be found in LabManager:''' | '''The user manual, technical information and contact information can be found in LabManager:''' | ||
'''[http://www.labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=163 Four point probe]''' | '''[http://www.labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=163 Four point probe]''' | ||
Revision as of 12:43, 21 June 2017
Probe Station
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The Four-Point Probe is a Veeco FPP-5000 for I/V measurement. The main purpose is to measure resistance and resistivity on a 4" silicon wafer. But can also be used to find thickness of thin layers or test if is a N- or P-type wafer.
The wafer are pushed down on the four pins so a measurement is performed. It works only for 4" wafers because a special holder is need.
The user manual, technical information and contact information can be found in LabManager: