Specific Process Knowledge/Thermal Process/Annealing: Difference between revisions

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*Wet anneal with H<math>_2</math>O in a bubbler can be done in furnaces:C2 and C3.
*Wet anneal with H<math>_2</math>O in a bubbler can be done in furnaces:C2 and C3.


==Comparing the seven annealing equipments==
==Comparison of the seven annealing equipments==
{| {{table}} border="2" cellspacing="0" cellpadding="8" width="1000pt"
{| {{table}} border="2" cellspacing="0" cellpadding="8" width="1000pt"
| valign="top" align="center" style="background:#f0f0f0;"|''''''
| valign="top" align="center" style="background:#f0f0f0;"|
| valign="top" align="center" style="background:#f0f0f0;"|'''A1 <br /> Boron drive-in'''
| valign="top" align="center" style="background:#f0f0f0;"|'''A1 <br /> Boron drive-in'''
| valign="top" align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in'''
| valign="top" align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in'''

Revision as of 07:34, 29 April 2008

Annealing

At Danchip we have seven furnaces and an RTP for annealing: A1,A3,C1,C2,C3,C4, noble furnace and RTP. Annealing normally takes place in an N atmosphere. PECVD PBSG is annealed in an wet atmosphere which will also oxidize the silicon substrate.

  • Anneal with N can be done in furnaces:A1,A3,C1,C2,C3,C4, noble furnace and RTP
  • Wet anneal with HO in a bubbler can be done in furnaces:C2 and C3.

Comparison of the seven annealing equipments

A1
Boron drive-in
A3
Phosphorous drive-in
C1
Gate oxide
C2
Anneal oxide
C3
Anneal bond
C4
Anneal aluminium
Nobel furnace RTP
General description Drive-in of boron deposited in the boron pre-dep furnace(A2) or drive-in of ion implanted boron. Can also be used for oxidation. Drive-in of phosphorous deposited in the phosphorous pre-dep furnace(A2) or drive-in of ion implanted phosphorous. Can also be used for oxidation. Oxidation of gate-oxide and other especially clean oxides. At the moment also used for general annealing and oxidation of 6" wafers. Annealing and oxidation of wafers from the B-stack and PECVD1. Annealing and oxidation of wafers from NIL. Annealing of wafers with aluminium. Annealing and oxidation of any material. Rapid thermal annealing.
Annealing with N x x x (with special permission) x x x x x
Wet annealing with bubler (water steam + N) . . . x x . . .
Process temperature [ oC ] 800-1150 800-1150 800-1150 800-1150 800-1150 800-1150 22-1000oC ?
Batch size max. 30 wafers of 4" or 2" max. 30 4" wafers or 2" wafers max. 30 wafers of 6",4" or 2" max. 30 4" wafers or 2" wafers max. 30 4" wafers or 2" wafers max. 30 4" wafers or 2" wafers 30x4" or small pieces ?
Which wafers are allowed to enter the furnace: A1
Boron drive-in
A3
Phosphorous drive-in
C1
Gate oxide
C2
Anneal oxide
C3
Anneal bond
C4
Anneal aluminium
Nobel RTP
New clean* Si wafers 4" (6" in C1) x x x (with special permission) x x x x x
RCA clean** Si wafers with no history of Metals on x x x (with special permission) x x x x x
From Predep furnace directly (e.g. incl. Predep HF**) From A2 From A4 . x x x x x
Wafers directly from PECVD1 . . . x x x x x
Wafers directly from NIL bonding . . . . x x x x
Wafers with aluminium . . . . . x x .
wafers with other metals . . . . . . x .
wafers with III-V materials x

*New clean: only right from the new clean box. It is not allowed to put them in another box first.

**These wafers must be placed in a "transport box from RCA to furnace" using the RCA carrier when doing RCA or the pre-dep carrier after pre-dep.