Specific Process Knowledge/Etch/DryEtchProcessing/Comparison: Difference between revisions
Appearance
No edit summary |
|||
| Line 1: | Line 1: | ||
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Etch/DryEtchProcessing/Comparison click here]''' | |||
== Hardware and option comparison of the dry etchers at Danchip == | == Hardware and option comparison of the dry etchers at Danchip == | ||
Revision as of 10:21, 3 March 2017
Feedback to this page: click here
Hardware and option comparison of the dry etchers at Danchip
The table below compares the hardware and the options.
| RIE2 | ASE | AOE | DRIE-Pegasus | ICP Metal etch | III-V RIE | III-V ICP | |||||||||||||||||||||||||||||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Purpose | Primary uses | The RIE chamber for etching of:
The users are allowed to have 5% metal exposed to the plasma |
Formerly the primary silicon etcher; now polymers may also be etched | Etching of silicon oxides or nitrides | Silicon etching | Standard recipes for etching of Al, Cr and Ti, now also etches of W, TiW and Mo | Etching of silicon oxide, resist, BCB, silicon nitride, InP, InGaAs and GaAs on III-V substrates | Etching of III-V materials such as GaN, InP/InGaAsP/InGaAs, AlGaAs, GaAs | |||||||||||||||||||||||||||||||||||||||||||
| Alternative/backup uses | Shallow silicon etches | Backup silicon etcher | Barc etch | Silicon etcher | |||||||||||||||||||||||||||||||||||||||||||||||
| General description | Plasma source | Parallel plate capacitor setup with RF power between the two electrodes | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Inductively coupled plasma chamber with two RF generators; the coil (with outer and inner coil) and platen generator | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Parallel plate capacitor setup with RF power between the two electrodes | Inductively coupled plasma chamber with two RF generators; the coil and platen generator
| |||||||||||||||||||||||||||||||||||||||||||
| Substrate cooling/temperature | The electrode is oil cooled: Fixed at 20oC | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 20oC | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 60oC | The electrode is oil cooled. Also, Helium backside cooling: -20oC to 30oC | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 50oC | The electrode is oil cooled: Fixed at 20oC | The electrode is oil cooled with a special chiller. Also, Helium backside cooling: 20oC to 180oC | ||||||||||||||||||||||||||||||||||||||||||||
| Clamping | No clamping | Electrostatic clamping (semco electrode) | Electrostatic clamping (TDESC) | Electrostatic clamping (TDESC) | Electrostatic clamping (TDESC) | No clamping | Mechanical clamping (weighted clamp with ceramic fingers) | ||||||||||||||||||||||||||||||||||||||||||||
| Gasses |
|
|
|
|
|
|
| ||||||||||||||||||||||||||||||||||||||||||||
| RF generators |
|
|
|
|
|
|
| ||||||||||||||||||||||||||||||||||||||||||||
| Substrate loading | Loading via cluster 2 load lock | Loading via dedicated two-slot carousel load lock | Loading via dedicated two-slot carousel load lock | Loading via dedicated two-slot carousel load lock or via atmospheric cassette loader | Loading via dedicated two-slot carousel load lock | Manual loading directly into process chamber | Loading via dedicated two-slot carousel load lock | ||||||||||||||||||||||||||||||||||||||||||||
| Options | Optical endpoint detector at fixed wavelength |
|
|
|
|
| |||||||||||||||||||||||||||||||||||||||||||||
| Allowed materials |
|
|
|
|
|
|
| ||||||||||||||||||||||||||||||||||||||||||||