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Specific Process Knowledge/Thin film deposition/Furnace LPCVD Nitride: Difference between revisions

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!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment  
!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment  
|style="background:WhiteSmoke; color:black"|<b>6" LPCVD nitride furnace (B2)</b>
|style="background:WhiteSmoke; color:black"|<b>6" LPCVD nitride furnace (E3)</b>
|style="background:WhiteSmoke; color:black"|<b>4" LPCVD nitride furnace (E3)</b>
|style="background:WhiteSmoke; color:black"|<b>4" LPCVD nitride furnace (B2)</b>
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!style="background:silver; color:black;" align="center"|Purpose  
!style="background:silver; color:black;" align="center"|Purpose  
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|style="background:LightGrey; color:black"|Gas flows
|style="background:LightGrey; color:black"|Gas flows
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|style="background:WhiteSmoke; color:black"|
*Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): 80 sccm
For Low stress nitride
*Ammonia (NH<sub>3</sub>): 20 sccm
*Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): 200 sccm
*Ammonia (NH<sub>3</sub>): 50 sccm
For Stoichiometric nitride on 6" wafers
*Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): 45 sccm
*Ammonia (NH<sub>3</sub>): 180 sccm
 
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): 20 sccm
*Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): 20 sccm
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|style="background:LightGrey; color:black"|Batch size
|style="background:LightGrey; color:black"|Batch size
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|style="background:WhiteSmoke; color:black"|
*1-15 100 mm wafers
*1-25 100 mm wafers
*1-25 150 mm wafers
Including a test wafer
Including a test wafer
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*1-25 100 mm wafers
*1-15 100 mm wafers
*1-25 150 mm wafers
Including a test wafer
Including a test wafer
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