Specific Process Knowledge/Thin film deposition/Furnace LPCVD Nitride: Difference between revisions
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!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | !colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | ||
|style="background:WhiteSmoke; color:black"|<b>6" LPCVD nitride furnace ( | |style="background:WhiteSmoke; color:black"|<b>6" LPCVD nitride furnace (E3)</b> | ||
|style="background:WhiteSmoke; color:black"|<b>4" LPCVD nitride furnace ( | |style="background:WhiteSmoke; color:black"|<b>4" LPCVD nitride furnace (B2)</b> | ||
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!style="background:silver; color:black;" align="center"|Purpose | !style="background:silver; color:black;" align="center"|Purpose | ||
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|style="background:LightGrey; color:black"|Gas flows | |style="background:LightGrey; color:black"|Gas flows | ||
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*Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): | For Low stress nitride | ||
*Ammonia (NH<sub>3</sub>): | *Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): 200 sccm | ||
*Ammonia (NH<sub>3</sub>): 50 sccm | |||
For Stoichiometric nitride on 6" wafers | |||
*Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): 45 sccm | |||
*Ammonia (NH<sub>3</sub>): 180 sccm | |||
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*Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): 20 sccm | *Dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>): 20 sccm | ||
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|style="background:LightGrey; color:black"|Batch size | |style="background:LightGrey; color:black"|Batch size | ||
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*1- | *1-25 100 mm wafers | ||
*1-25 150 mm wafers | |||
Including a test wafer | Including a test wafer | ||
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*1- | *1-15 100 mm wafers | ||
Including a test wafer | Including a test wafer | ||
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