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Topographic measurements are measurements were you can measure hight differences on your substrate. If you measure in many spots of the substrate you can get a topographic image of the substrate.
Topographic measurements are measurements were you can measure hight differences on your substrate. If you measure in many spots of the substrate you can get a topographic image of the substrate.


At Danchip we have four systems for topographic measurements:
At Danchip we have five systems for topographic measurements:
*Dektak stylus profilers (Dektak XTA and Dektak 8) - ''Profiler for measuring micro structures''  
*Dektak stylus profilers (Dektak XTA, Dektak III-V profiler and Dektak 8) - ''Profiler for measuring micro structures''  
*Optical Profiler (Sensofar) - ''3D Profiler for measuring micro structures''
*Optical Profiler (Sensofar) - ''3D Profiler for measuring micro structures''
*Nanoman - ''AFM for measuring nano structures''
*Nanoman - ''AFM for measuring nano structures''
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