Specific Process Knowledge/Thin film deposition/Deposition of AZO: Difference between revisions
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* Carbon | * Carbon | ||
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* Silicon | *Silicon | ||
* Silicon oxide | *Silicon oxide, silicon nitride | ||
*Quartz/fused silica | |||
* | *Al, Al<sub>2</sub>O<sub>3</sub> | ||
* | *Ti, TiO<sub>2</sub> | ||
* | *Other metals (use dedicated carrier wafer) | ||
* | *III-V materials (use dedicated carrier wafer) | ||
* | *Polymers (depending on the melting point/deposition temperature, use carrier wafer) | ||
* | |||
Revision as of 13:34, 30 January 2017
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AZO can be deposited by Sputtering process and atomic layer deposition (ALD). In the chart below you can compare the different deposition equipment.
| Sputtering deposition (Lesker) | Atomic layer deposition (ALD Picosun R200) | |
|---|---|---|
| General description | Sputter deposition of AZO | Atomic layer deposition of AZO |
| Pre-clean | RF Ar clean | |
| Layer thickness | 10Å to 5000Å* | |
| Deposition rate | Depending on process parameters. | |
| Batch size |
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| Allowed materials |
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| Comment |
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* For thicknesses above 200 nm permission is required.