Jump to content

Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

← Older editNewer edit →
VisualWikitext
Pevo (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
2,331 edits
Pevo (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
2,331 edits
Line 168: Line 168:
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
* X, Y: 35 mm
* X, Y: 35 mm
* T: 0<sup>o</sup>
* T: No tilt
* R: 360<sup>o</sup>
* R: No rotation
* Z: 0 mm
* Z: 0 mm
|-
|-
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy"