Specific Process Knowledge/Bonding: Difference between revisions
No edit summary |
No edit summary |
||
Line 51: | Line 51: | ||
== Choose equipment == | == Choose equipment == | ||
*EVG NIL | *EVG NIL |
Revision as of 11:18, 13 March 2008
Choose bonding method
Comparing the three bonding methods in the EVG NIL
. | Eutectic bonding | Fusion bonding | Anodic bonding |
---|---|---|---|
General description | For bonding two substrates by use of an interphase that makes an eutecticum. | For bonding two identical materials. | For bonding Si and Glass. |
Bonding temperature | Depending on the eutecticum 310C to 400C. | Depending on defects 50C to 400C. | Depending on the voltage 300C to 500C Standard is 400C. |
Annnealing temperature | No annealing | 1000C in the bond furnace C3 | No annealing |
Materials possible to bond | Bonding of substrates is done by use of the eutectica Au/Si, Au/Sn and Au/Sn/Ni | Si/Si, SiO/SiO | Si/Pyrex (glass) |
Substrate size | Up to 6" (aligning only possible for 4" and 6") | Up to 6" (aligning only possible for 4" and 6") | Up to 6" (aligning only possible for 4" and 6") |
Cleaning | Cleaning by N2. | Wet chemical cleaning, IMEC. | Cleaning by N2. |
IR alignment | Double side polished wafers. | Double side polished wafers. | Not relevant. |
Choose equipment
- EVG NIL