LabAdviser/314/Microscopy 314-307/TEM/T20: Difference between revisions
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A general schematic of a transmission electron microscope can be found [[Specific Process Knowledge/Characterization/Tecnai TEM/Schematic|here]] | A general schematic of a transmission electron microscope can be found [[Specific Process Knowledge/Characterization/Tecnai TEM/Schematic|here]] | ||
A general schematic of a transmission electron microscope can be found [[/Schematic|here]] | |||
= Sample holders = | = Sample holders = | ||
Revision as of 10:17, 26 July 2016
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Tecnai TEM
CEN’s Tecnai is a transmission electron microscope (TEM) used for performing both conventional, high resolution and scanning transmission microscopy (STEM) measurements. It is a versatile instrument, ideal for studying a wide range of general and advanced materials, soft matter, composites, etc. The microscope is equipped to carry out chemical analysis as well as Cryo-TEM for soft materials.
The Tecnai TEM is a transmission electron microscope equipped with a thermionic electron source with a Lab6 filament and acceleration voltages that can vary between 80-200 kV. This gives the microscope a resolution @ 200 kV of 1.4 Å in TEM mode. Other tecniques available on the microscope are scanning transmission electron microscopy (STEM, resolution 10 Å) with a high-angle annular dark-field detector (HAADF).
On the analytical side, the microscope is equipped with an Oxford X-Max SDD X-ray detector for Energy Dispersive X-ray (EDX) spectroscopy and a Gatan Tridiem 863 imaging filter allowing for electron energy-loss spectroscopy (EELS) and energy-filtered imaging. For imaging, the microscope is equipped with Gatan US1000 CCD cameras before and after the energy filter.
TEM Schematic
A general schematic of a transmission electron microscope can be found here A general schematic of a transmission electron microscope can be found here
Sample holders
The default specimen holder for the Tecnai TEM is called Single-Tilt (FEI ST) and it is always present in the Tecnai room.
The lab has also other specimen holders used for various application e.g. heating (furnace and MEMS-based), cooling, biasing and tomography. For information on the various specimen holders see HERE
Who may operate the TEM Tecnai
Anybody in need of a TEM microscope is welcome to apply for access to our facility by submitting an Access Request Form .Shortly after your ARF has been received you will be contact by the technical support team in order to set up a meeting to further discuss your application.
In order to be authorised to use the Tecnai TEM you must compete the Tecnai training with consists of a theoretical lecture and 3 practical sessions of 4 hours each.
Due to the similarity of the basic operations on a Tecnai TEM and a Titan TEM, a Tecnai trained user can receive additional training and progress in using a Titan TEM.
When you have demonstrated a high level of familiarity with the Tecnai TEM you will be authorized and allowed to book it via our booking system called LabManager.
Booking Rules
Tecnai Booking rules can be found here
Contact information can be found in LabManager
Process/ Technique information
Comparison between TEMs at DTU Cen
| Microscope | |||||
|---|---|---|---|---|---|
| Purpose |
|
|
|
| |
| Resolution | TEM mode |
>3.5 Å |
1.44 Å |
1.02 Å |
0.9 Å |
| STEM mode |
no STEM |
about 10 Å |
0.8 Å |
1.36 Å | |
| Spectroscopy | EDX |
Oxford X-Max 80T/AZtec |
Oxford X-Max 80T/AZtec |
Oxford X-Max 100TLE/AZtec |
Oxford X-Max 80T/AZtec |
| EELS |
no EELS |
Gatan 863 Tridiem GIF |
Gatan 865 Tridiem GIF |
Gatan 866 Tridiem GIF | |
Reference material
Books:
L. Reimer, Transmission Electron Microscopy - Physics of image formation and microanalysis (Springer, 1997).
David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009).
Online Material:
Tutorials in Transmission Electron Microscopy by John Rodenburg