Specific Process Knowledge/Wafer and sample drying/Critical Point Dryer: Difference between revisions

Revision as of 11:24, 29 June 2016 view source Paphol (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers 912 edits →Comparison of samples dried in air and with Critical Point Dryer ← Older edit		Revision as of 11:24, 29 June 2016 view source Paphol (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers 912 edits →Comparison of samples dried in air and with Critical Point Dryer Newer edit →
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	'''Dried with Critical Point Dryer'''. The cantilevers are free hanging, and have not bended. The dimensions of the cantilevers are 100 x 710 µm, and the thickness is about 0.5 µm.		'''Dried with Critical Point Dryer'''. The cantilevers are free hanging, and have not bended. The dimensions of the cantilevers are 100 x 710 µm, and the thickness is about 0.5 µm.







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	'''Dried with the Critical Point Dryer'''. The cantilevers structures are free hanging after the drying.		'''Dried with the Critical Point Dryer'''. The cantilevers structures are free hanging after the drying.