Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions
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# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Survey spectra analysis: Open data | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Survey spectra analysis: Open data]] | ||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Spectrum_views|Spectrum views]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Views_of_data_with_several_etch_levels|View of data with several levels]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Zooming|Zooming]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Automatic_peak_identification_of_survey_spectra|Automatic peak ID]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Zooming|Zooming]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Manually_add_peaks_to_identification_of_survey_spectra|Manual ID]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Make_a_depth_profile_from_survey_spectrum|Depth profile]] | |||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|High resolution spectra analysis: Open spectra, add background and peaks, apply constraints to fitting]] | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|High resolution spectra analysis: Open spectra, add background and peaks, apply constraints to fitting]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]] | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]] | ||