Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy/samplemount: Difference between revisions
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: Finding the right feature on a sample is more tricky than one would think due to the limited field of view. Making sketches of feature positions on the sample or drawing on the sample itself is often a great help. | : Finding the right feature on a sample is more tricky than one would think due to the limited field of view. Making sketches of feature positions on the sample or drawing on the sample itself is often a great help. | ||
; Limit cross contamination issues | ; Limit cross contamination issues | ||
: | : Sticking your sample onto carbon pad that is already sitting on a pin stub is a very fast way to get started - but it is not a very clever one. Using old carbon pads has many disadvantages: | ||
; Optimize imaging conditions | * The electrical conductivity of the carbon pad degrades over time and you will have charging problems | ||
: Poorly mounted samples are much more likely to vibrate or charge | ; Optimize imaging conditions hence image quality. | ||
: Poorly mounted samples are much more likely to vibrate or charge. | |||
Respect the guidelines on sample mounting in the next sections and you will maximize the results of your efforts at the SEM. | Respect the guidelines on sample mounting in the next sections and you will maximize the results of your efforts at the SEM. | ||