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Specific Process Knowledge/Thin film deposition/ALD Picosun R200/ALD multilayers: Difference between revisions

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This recipe has been developd for fabrication of high quality homogenious optical layers at low temperature. The deposited TiO<sub>2</sub> layers are amorphous.
{| border="2" cellspacing="2" cellpadding="3" colspan="10"
|bgcolor="#98FB98" |'''Al<sub>2</sub>O<sub>3</sub> deposition at 120 <sup>o</sup>C'''
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{| {{table}}
| align="center" |
{| border="2" cellspacing="2" cellpadding="3"  align="center" style="width:750px"
! colspan="5" |Deposition conditions at 120 <sup>o</sup>C for Al2O3 LT recipe
|-
!Number of cycles
|<b>Thickness (nm)</b>
|<b>Uniformity across 100mm Si substrate (%)</b>
|<b>Standard deviation error</b>
|<b>Refractive index @ 632.8 nm</b>
|-
|250
|10.17
|2.19
|0.14
|2.18
|-
|500
|23.12
|1.80
|0.23
|2.40
|-
|750
|34.13
|1.87
|0.39
|2.39
|-
|1000
|46.13
|1.78
|0.50
|2.39
|-
|}
|-
|}
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
Deposition rate: <b>0.048 nm/cycle </b>(@ 120 <sup>o</sup>C)
Deposition rate: <b>0.048 nm/cycle </b>(@ 120 <sup>o</sup>C)