Specific Process Knowledge/Etch/ICP Metal Etcher/silicon oxide/By Peixiong: Difference between revisions
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| width=119 style='width:89.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #E9EDF4;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:29.25pt' | <p class=MsoNormal><span lang=DA>13.6%</span></p> | | width=119 style='width:89.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #E9EDF4;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:29.25pt' | <p class=MsoNormal><span lang=DA>13.6%</span></p> | ||
| width=121 style='width:91.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #E9EDF4;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:29.25pt' | <p class=MsoNormal><span lang=DA>17%</span></p> | | width=121 style='width:91.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #E9EDF4;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:29.25pt' | <p class=MsoNormal><span lang=DA>17%</span></p> | ||
| width=128 style='width:96.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #E9EDF4;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:29.25pt' | | |||
|- style='height:52.5pt' | |||
| width=136 style='width:102.0pt;border:solid white 1.0pt;border-top:none; background:#D0D8E8;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:52.5pt' | | |||
| width=136 style='width:102.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #D0D8E8;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:52.5pt' | <p class=MsoNormal><span lang=DA>Images </span></p> | |||
| width=108 style='width:81.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #D0D8E8;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:52.5pt' | <p class=MsoNormal></p> | |||
| width=119 style='width:89.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #D0D8E8;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:52.5pt' | <p class=MsoNormal>Too much polymer, etch Si too much</p><p class=MsoNormal>Etch through 500nm apox, then etch Si 180nm,</p> | |||
| width=121 style='width:91.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #D0D8E8;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:52.5pt' | <p class=MsoNormal>Profile Very good, 2min etch SiO3 350nm in wafer center, | |||
310nm in wafer, resist etched 260nm</p> | |||
| width=128 valign=top style='width:96.0pt;border-top:none;border-left: none;border-bottom:solid white 1.0pt;border-right:solid white 1.0pt; background:#D0D8E8;padding:3.6pt 7.2pt 3.6pt 7.2pt;height:52.5pt' | <p class=MsoNormal>Low pressure gives better profile, less polymer, however, | |||
CF4 etch Si too quick</p> | |||
| width=128 style='width:96.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #E9EDF4;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:29.25pt' | | | width=128 style='width:96.0pt;border-top:none;border-left:none; border-bottom:solid white 1.0pt;border-right:solid white 1.0pt;background: #E9EDF4;padding:2.25pt 2.25pt 2.25pt 2.25pt;height:29.25pt' | | ||
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Revision as of 14:30, 2 May 2016
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THIS PAGE IS UNDER CONSTRUCTION
With CF4 and H2 chemistry
bad |
bad |
bad |
bad |
bad |
|
Date |
Feb122013 |
Feb122013 |
Feb122013 |
Feb122013 |
Feb122013 |
Metal ICP recipe |
pxSiO2try1 |
pxSiO2try1 |
pxSiO2try1 |
pxSiO2try2 |
pxSiO2try2 |
Wafer size and ID |
6inch 6A |
6inch 6A1_feb112013 |
6inch, 6A2_feb112013 |
6inch, 6A3_feb112013 |
6inch, 6A4_feb112013 |
Mask |
Blank Si dummy test |
Blank apox, 3539nm |
Blank KRF 347.9nm |
Blank KRF 345nm |
Blank apox 4623m |
Etch time |
2min |
2min |
1min |
1min |
1min |
Pressure [mTorr] |
8 |
8 |
8 |
20 |
20 |
C4F8 flow [sccm] |
20 |
20 |
20 |
20 |
|
CF4 flow [sccm] |
40 |
40 |
40 |
40 |
40 |
H2 flow [sccm] |
20 |
20 |
20 |
20 |
20 |
Coil Power [W] |
800 |
800 |
800 |
800 |
800 |
Platen Power [W] |
200 |
200 |
200 |
200 |
200 |
Platen temperature [oC] |
20 |
20 |
20 |
20 |
20 |
Coil match |
59%, 27% |
59%, 27% |
59%, 27% |
48%, 29% |
48%, 29% |
Platen Match |
45%, 56% |
45%, 56% |
45%, 56% |
52%, 60% |
52%, 60% |
Throde valve opening rate |
16% |
16% |
16% |
10.7% |
10.7% |
Etch rate |
µm/min |
Wf center 238µm/min Wafer edge 230nm/min |
Wafer center 170.5nm/min 1cm from wf edge , 204.1nm/min |
Wf center 80.4µm/min Wafer edge 119.6nm/min |
Wafer center 128.26nm/min, 1cm from wafer edge 123.09nm/min |
Distance from wf cent (mm) |
Seletivity at cent |
||||
Remaining APOX thickness nm |
Wf center 3062nm 1cm from wf edge: 3079nm |
Wf center nm |
Too much polymer in sem |
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Comments |
bad |
bad |
bad |
Very good |
|||
ICP metal etch SiO2 by reist mask try |
Date |
Feb252013 |
Feb252013 |
Feb262013 |
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Metal ICP recipe |
pxSiO2try3 |
pxSiO2try4 |
pxSiO2try5 |
|||
Wafer size and ID |
6inch, 6A1_feb252013 |
6inch, 6A6_feb252013 |
6inch, 6A1_feb252013 |
|||
Mask |
980nm resist resist on 62nmBarc on 1190nm apox |
780nm resist on 62nmBarc on 492nm apox, first etch barc 20sec by Ox plasma |
440nm resist on 62nmBarc on 1800nm apox, first etch barc 20sec by Ox plasma |
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Etch time |
3min |
3min |
2min |
|||
Pressure [mTorr] |
15 |
8 |
6 |
|||
C4F8 flow [sccm] |
0 |
0 |
0 |
|||
CF4 flow [sccm] |
40 |
40 |
40 |
|||
H2 flow [sccm] |
30 |
30 |
30 |
|||
Coil Power [W] |
800 |
800 |
800 |
|||
Platen Power [W] |
200 |
200 |
100 |
|||
Platen temperature [oC] |
20 |
20 |
20 |
|||
Coil match |
50%, 30% |
59%, 27% |
60%,27% |
|||
Platen Match |
50%, 57% |
44%, 56% |
40%,53% |
|||
Throde valve opening rate |
10% |
13.6% |
17% |
|||
Images |
Too much polymer, etch Si too much Etch through 500nm apox, then etch Si 180nm, |
Profile Very good, 2min etch SiO3 350nm in wafer center, 310nm in wafer, resist etched 260nm |
Low pressure gives better profile, less polymer, however, CF4 etch Si too quick |
|||
Comments |
Apox etch 550nm for 3min, side wall angle 71degree |
Too much polymer, etch Si too much Etch through 500nm apox, then etch Si 180nm, |
Profile Very good, 2min etch SiO3 350nm in wafer center, 310nm in wafer, resist etched 260nm |
Low pressure gives better profile, less polymer, however, CF4 etch Si too quick |