Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions
| Line 87: | Line 87: | ||
|- | |- | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
* ~ 5 | * ~ 5 nm (limited by vibrations) | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
* 1-2 nm (limited by vibrations) | * 1-2 nm (limited by vibrations) | ||
| Line 213: | Line 213: | ||
<br clear="all" /> | <br clear="all" /> | ||
==Comparison of the SEM's at CEN [[image:Under_construction.png|50px]]== | ==Comparison of the SEM's at CEN [[image:Under_construction.png|50px]]== | ||