Jump to content

Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions

Bghe (talk | contribs)
No edit summary
Bghe (talk | contribs)
Line 25: Line 25:


*Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion]
*Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion]
*or you can install Brukers own software analyses program that can be found on the cleanroom drive: U:\DCH\CleanroomDrive\_Equipment\AFM\NanoScope_Analysis_x64_v150b53.exe
*or you can install Brukers own software analyses program that can be found on the cleanroom drive: U:\DCH\CleanroomDrive\_Equipment\AFM\NanoScope_Analysis_x86_v170r1sr2.exe
*or you can get a SPIP license for free if you are connected one of the following institutes (Nanotech, Physics, Chemistry, Mechanics, CEN, Danchip, Energikonvertering) , by contacting [mailto:jotri@adm.dtu.dk John Tandrup Riedel]
*or you can get a SPIP license for free if you are connected one of the following institutes (Nanotech, Physics, Chemistry, Mechanics, CEN, Danchip, Energikonvertering) , by contacting [mailto:jotri@adm.dtu.dk John Tandrup Riedel]