LabAdviser/Technology Research/Microfabrication of Hard x-ray Lenses: Difference between revisions
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*Project responsible: Frederik Stöhr | *Project responsible: Frederik Stöhr | ||
*Sites involved: DTU Physics, DTU Danchip, DTU Nanotech | *Sites involved: DTU Physics, DTU Danchip, DTU Nanotech | ||
*Link to the Ph.d. thesis | |||
==Project description (Summery of Ph.d. | ==Project description (Summery of Ph.d. thesis)== | ||
This thesis deals with the development of silicon compound refractive lenses (Si-CRLs) for shaping hard x-ray beams. The CRLs are to be fabricated using state of the art microfabrication techniques. The primary goal of the thesis work is to produce Si-CRLs with considerably increased structure heights and improved uniformity compared to what is currently available. To this end, established fabrication procedures are improved and the toolbox used for lens development is enriched. | This thesis deals with the development of silicon compound refractive lenses (Si-CRLs) for shaping hard x-ray beams. The CRLs are to be fabricated using state of the art microfabrication techniques. The primary goal of the thesis work is to produce Si-CRLs with considerably increased structure heights and improved uniformity compared to what is currently available. To this end, established fabrication procedures are improved and the toolbox used for lens development is enriched. | ||
The central theme of this thesis is x-ray microscopy (XRM). As a spearhead of today’s materials research it provides characterization details that cannot be obtained by other means. The respective x-ray techniques largely benefit from continuously improved x-ray sources, x-ray detectors and x-ray optics. For instance, some techniques aiming for structural investigation of poly-crystalline materials directly benefit from more intense and wider line beams with narrower waists. | The central theme of this thesis is x-ray microscopy (XRM). As a spearhead of today’s materials research it provides characterization details that cannot be obtained by other means. The respective x-ray techniques largely benefit from continuously improved x-ray sources, x-ray detectors and x-ray optics. For instance, some techniques aiming for structural investigation of poly-crystalline materials directly benefit from more intense and wider line beams with narrower waists. | ||