Specific Process Knowledge/Etch/DryEtchProcessing/Comparison: Difference between revisions
Created page with "== Hardware and option comparison of the dry etchers at Danchip == The table below compares the hardware and the options. {| border="2" cellspacing="0" cellpadding="0" align..." |
|||
Line 117: | Line 117: | ||
| H<sub>2</sub> | | H<sub>2</sub> | ||
|- | |- | ||
| BCl<sub>3</sub> | | BCl<sub>3</sub> | ||
| Cl<sub>2</sub> | | Cl<sub>2</sub> | ||
| HBr | | HBr | ||
|} | |} |
Revision as of 11:34, 7 January 2016
Hardware and option comparison of the dry etchers at Danchip
The table below compares the hardware and the options.
RIE2 | ASE | AOE | DRIE-Pegasus | ICP Metal etch | III-V RIE | III-V ICP | |||||||||||||||||||||||||||||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Purpose | Primary uses | The RIE chamber for etching of:
The users are allowed to have 5% metal exposed to the plasma |
Formerly the primary silicon etcher; now polymers may also be etched | Etching of silicon oxides or nitrides | Silicon etching | Standard recipes for etching of Al, Cr and Ti, now also etches of W, TiW and Mo | Etching of silicon oxide, resist, BCB, silicon nitride, InP, InGaAs and GaAs on III-V substrates | Etching of III-V materials such as GaN, InP/InGaAsP/InGaAs, AlGaAs, GaAs | |||||||||||||||||||||||||||||||||||||||||||
Alternative/backup uses | Shallow silicon etches | Backup silicon etcher | Barc etch | Silicon etcher | |||||||||||||||||||||||||||||||||||||||||||||||
General description | Plasma source | Parallel plate capacitor setup with RF power between the two electrodes | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Inductively coupled plasma chamber with two RF generators; the coil (with outer and inner coil) and platen generator | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Parallel plate capacitor setup with RF power between the two electrodes | Inductively coupled plasma chamber with two RF generators; the coil and platen generator
| |||||||||||||||||||||||||||||||||||||||||||
Substrate cooling/temperature | The electrode is oil cooled: Fixed at 20oC | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 20oC | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 60oC | The electrode is oil cooled. Also, Helium backside cooling: 0oC to 50oC | The electrode is oil cooled. Also, Helium backside cooling: -20oC to 30oC | The electrode is oil cooled: Fixed at 20oC | The electrode is oil cooled with a special chiller. Also, Helium backside cooling: 20oC to 180oC | ||||||||||||||||||||||||||||||||||||||||||||
Clamping | No clamping | Electrostatic clamping (semco electrode) | Electrostatic clamping (TDESC) | Electrostatic clamping (TDESC) | Electrostatic clamping (TDESC) | No clamping | Mechanical clamping (weighted clamp with ceramic fingers) | ||||||||||||||||||||||||||||||||||||||||||||
Gasses |
|
|
|
|
|
|
| ||||||||||||||||||||||||||||||||||||||||||||
RF generators |
|
|
|
|
|
|
| ||||||||||||||||||||||||||||||||||||||||||||
Substrate loading | Loading via cluster 2 load lock | Loading via dedicated two-slot carousel load lock | Loading via dedicated two-slot carousel load lock | Loading via dedicated two-slot carousel load lock or via atmospheric cassette loader | Loading via dedicated two-slot carousel load lock | Manual loading directly into process chamber | Loading via dedicated two-slot carousel load lock | ||||||||||||||||||||||||||||||||||||||||||||
Options | Optical endpoint detector at fixed wavelength |
|
|
|
|
| |||||||||||||||||||||||||||||||||||||||||||||
Allowed materials |
|
|
|
|
|
|
|