Specific Process Knowledge/Wafer cleaning/RCA: Difference between revisions
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|'''General description''' | |'''General description''' | ||
| | | | ||
It is used for removal of light organics, particles and metal. | |||
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It is used for removal of light organics, particles and metal. | |||
| | | | ||
It is used for removal of oxide generated in RCA1 and RCA2 | |||
|- | |- | ||
|'''Chemical solution''' | |'''Chemical solution''' | ||
| | |H<math>_2</math>O, NH<math>_4</math>OH and H<math>_2</math>O<math>(29%)_2</math>(30%) (5:1:1) | ||
|H<math>_2</math>0, HCl(37%) and H<math>_2</math>O<math>_2</math>(30%) (5:1:1) | |||
|5% HF | |||
|- | |- | ||
|'''Process temperature''' | |'''Process temperature''' | ||
|80 <sup>o</sup>C | |70-80 <sup>o</sup>C | ||
|70-80 <sup>o</sup>C | |||
| | |Room temperature | ||
|- | |- | ||
|'''Process time''' | |'''Process time''' | ||
Line 48: | Line 49: | ||
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10 min. | 10 min. | ||
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30 sec. | |||
|- | |- | ||
|'''Allowed materials''' | |'''Allowed materials''' | ||
| | | | ||
*Silicon | |||
*Silicon oxide | |||
*Silicon nitride | |||
*Quartz wafers | |||
| | | | ||
*Silicon | |||
*Silicon oxide | |||
*Silicon nitride | |||
*Quartz wafers | |||
| | |||
*Silicon | |||
*Silicon oxide | |||
*Silicon nitride | |||
|- | |- | ||
|'''Batch size''' | |'''Batch size''' | ||
| | | | ||
1- | 1-25 4" or 6" wafers at a time | ||
| | |||
1-25 4" or 6" wafers at a time | |||
| | | | ||
1- | 1-25 4" or 6" wafers at a time | ||
|- | |- | ||
|'''Size of substrate''' | |'''Size of substrate''' | ||
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4-6" wafers | 4"-6" wafers | ||
| | | | ||
4"-6" wafers | |||
|- | |- | ||
|} | |} |
Revision as of 13:49, 27 February 2008
RCA cleaning
The RCA clean is used for cleaning the wafers before taking them into the furnaces and a few other equipments (check the cross contamination sheet). It consist of two solutions: RCA1 and RCA2 plus diluted HF.
The RCA1 contains: HO, NHOH and HO (5:1:1). It is used for removed of light organics, particles and metal.
The RCA2 contains: H0, HCl and HO (5:1:1). It is used for removal of heavy metals, alkalies and metal hydroxides.
RCA procedure
- RCA1: 10 min
- DI wafer rinsing (dumping three times)
- HF: 30 sec (avoid it if you have oxide as the top layer)
- DI wafer rinsing (dumping three times)
- RCA2: 10 min
- DI wafer rinsing (dumping three times)
- HF: 30 sec (avoid it if you have oxide as the top layer)
- DI wafer rinsing (dumping three times)
Overview of RCA process data
RCA1 | RCA2 | HF | |
---|---|---|---|
General description |
It is used for removal of light organics, particles and metal. |
It is used for removal of light organics, particles and metal. |
It is used for removal of oxide generated in RCA1 and RCA2 |
Chemical solution | HO, NHOH and HO(30%) (5:1:1) | H0, HCl(37%) and HO(30%) (5:1:1) | 5% HF |
Process temperature | 70-80 oC | 70-80 oC | Room temperature |
Process time |
10 min. |
10 min. |
30 sec. |
Allowed materials |
|
|
|
Batch size |
1-25 4" or 6" wafers at a time |
1-25 4" or 6" wafers at a time |
1-25 4" or 6" wafers at a time |
Size of substrate |
4"-6" wafers |
4"-6" wafers |