Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions
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# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Open data, spectrum views, depth profile, survey spectrum peak identification, click here]] | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Open data, spectrum views, depth profile, survey spectrum peak identification, click here]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|Open high resolution spectra, add background and peaks]] | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|Open high resolution spectra, add background and peaks, apply constraints to fitting]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]] | |||
Revision as of 13:21, 10 September 2015
XPS data processing guide
This section is intended as an introduction to the analysis of XPS data. Simple examples are chosen to illustrate the procedures. All actions performed with Avantage (version 5.498) during an analysis of a sample are shown.
In case you want to follow along with your own analysis, you can download the data from here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip)