Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions
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<span style="font-size: 90%; text-align: right;">[[Specific_Process_Knowledge/Characterization/XPS/Processing/Basics#top|Go to top of this page]]</span> | <span style="font-size: 90%; text-align: right;">[[Specific_Process_Knowledge/Characterization/XPS/Processing/Basics#top|Go to top of this page]]</span> | ||
In the top are several | In the top are several buttons in the 'Analysis' toolbar. Click the leftmost one called Automatic Survey ID and a automated peak identification routine will commence. The result is shown below: | ||
[[File:XPS- | [[File:XPS-basics06.jpg|700px]] | ||
Several things are worth noting: | Several things are worth noting: | ||
* A peak table pops up above the spectrum. It contains information (which elements, fitted atomic percentages etc.) obtained in the automatic fitting routine. One can still scroll through the levels (if more levels in a depth profile are available) but the elements fitted will not change. | * A peak table pops up above the spectrum. It contains information (which elements, fitted atomic percentages etc.) obtained in the automatic fitting routine. One can still scroll through the levels (if more levels in a depth profile are available) but the elements fitted will not change. | ||
* Only a fraction of the peaks in the spectrum | * Only a fraction of the peaks in the spectrum | ||