Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions

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 [[File:XPS-basics03a.jpg|700px]]
-As shown in the bottom of the image above, this experiment holds several levels - the reason is that the exeriment is a depth profile in which a repeated set of  spectra of a sample are recorded as the surface is gradually removed by an ion bombardment. Scroll through the individual levels, either by using the 'Etch time' or 'Etch Level' scroll buttons and see how the spectra change. Level 0 is the first spectrum.
+== Views of data with several levels ==
-If more levels (such as in a depth profile) are available, one can change the display mode:
+As shown in the bottom of the image below, some experiments hold several levels - the reason is that the exeriment is a depth profile in which a repeated set of  spectra of a sample are recorded as the surface is gradually removed by an ion bombardment. Scroll through the individual levels, either by using the 'Etch time' or 'Etch Level' scroll buttons and see how the spectra change. Level 0 is the first spectrum.
+[[File:XPS-basics03b.jpg|700px]]
+The view called 'Single Trace' displays only one level. Change the display mode to view the complete set of levels:
 <gallery caption="Different views of spectra in experiments with several levels" widths="350" perrow="2">