Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions
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[[File:XPS-basics03a.jpg|700px]] | [[File:XPS-basics03a.jpg|700px]] | ||
As shown in the bottom of the image above, this experiment holds several levels - the reason is that the exeriment is a depth profile in which a repeated set of spectra of a sample are recorded as the surface is gradually removed by an ion bombardment. Scroll through the individual levels, either by using the 'Etch time' or 'Etch Level' scroll buttons and see how the spectra change. Level 0 is the first spectrum. | |||
If more levels (such as in a depth profile) are available, one can change the display mode: | |||
<gallery caption="Different views of spectra in experiments with several levels" widths="350" perrow="2"> | |||
Image:XPS-basics03display3.jpg | 2D Chart view | |||
Image:XPS-basics03display4.jpg | Stacked Chart view | |||
Image:XPS-basics03display1.jpg | 3D Chart view | |||
Image:XPS-basics03display2.jpg | Image view | |||
</gallery> | |||
== Different views of spectra == | == Different views of spectra == | ||