Specific Process Knowledge/Characterization/XPS/XPS technique: Difference between revisions
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XPS is a surface sensitive and non destructive technique used for analysis of the elemental composition of a sample. The basic principle is shown below (the image is taken from Wikipedia). | XPS is a surface sensitive and non destructive technique used for analysis of the elemental composition of a sample. The basic principle is shown below (the image is taken from Wikipedia). | ||
[[File:800px-XPS_PHYSICS.jpg|700px| frameless|link=https://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy|XPS principle. Image taken from wikipedia - click on image to access wikipedia.]] | [[File:800px-XPS_PHYSICS.jpg|700px| frameless|link=https://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy|XPS principle. Image taken from wikipedia - click on image to access wikipedia directly.]] | ||
The analysis relies on the sequence: | The analysis relies on the sequence: | ||