Specific Process Knowledge/Characterization: Difference between revisions
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'''Optical microscopes''' | '''Optical microscopes''' | ||
*[[/Optical microscope|Optical microscope]] | *[[/Optical microscope|Optical microscope]] | ||
Optical characterization | '''Optical characterization''' | ||
*[[/Optical characterization#Ellipsometer|Ellipsometer]] | *[[/Optical characterization#Ellipsometer|Ellipsometer]] | ||
*[[/Optical characterization#Filmtek_4000|Filmtek 4000]] | *[[/Optical characterization#Filmtek_4000|Filmtek 4000]] | ||
*[[/Optical characterization#Prism_Coupler|Prism Coupler]] | *[[/Optical characterization#Prism_Coupler|Prism Coupler]] | ||
*[[/PL Mapper|PL mapper - ''Photoluminescence mapper'']] | *[[/PL Mapper|PL mapper - ''Photoluminescence mapper'']] | ||
Element analysis | '''Element analysis''' | ||
*[[/SIMS: Secondary Ion Mass Spectrometry#Atomika_SIMS|Atomika SIMS]] | *[[/SIMS: Secondary Ion Mass Spectrometry#Atomika_SIMS|Atomika SIMS]] | ||
*[[/XPS#XPS-ThermoScientific|XPS-ThermoScientific ]] | *[[/XPS#XPS-ThermoScientific|XPS-ThermoScientific ]] | ||
'''Various''' | |||
*[[/Drop Shape Analyzer|Drop Shape Analyzer]] | *[[/Drop Shape Analyzer|Drop Shape Analyzer]] | ||