Specific Process Knowledge/Characterization/XPS/XPS technique: Difference between revisions
| Line 5: | Line 5: | ||
=XPS technique= | =XPS technique= | ||
XPS is a surface sensitive and non destructive technique used for analysis of the elemental composition of a sample. The basic principle is shown below. | XPS is a surface sensitive and non destructive technique used for analysis of the elemental composition of a sample. The basic principle is shown below (the image is taken from Wikipedia). | ||
[[File:800px-XPS_PHYSICS.jpg|700px| frameless|link=https://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy|XPS principle. Image taken from wikipedia.]] | [[File:800px-XPS_PHYSICS.jpg|700px| frameless|link=https://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy|XPS principle. Image taken from wikipedia.]] | ||