Specific Process Knowledge/Characterization/XPS: Difference between revisions
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*[[Specific Process Knowledge/Characterization/XPS/XPS Depth profiling|Depth profiling]] | *[[Specific Process Knowledge/Characterization/XPS/XPS Depth profiling|Depth profiling]] | ||
*[[/Carbon contamination|Carbon contamination]] | *[[/Carbon contamination|Carbon contamination]] | ||
The analysis of XPS spectra is an art in itself. | |||
Below is collection of examples (ehh..not yet but hopefully quite soon) in which the Avantage software package has been used to extract information from experiments. | |||
**[[Specific Process Knowledge/Characterization/XPS/DataAnalysis|XPS data analysis]] | |||
==Equipment performance of XPS-ThermoScientific== | ==Equipment performance of XPS-ThermoScientific== | ||