Specific Process Knowledge/Characterization/XPS/XPS technique: Difference between revisions
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; Generation of photoelectrons | ; Generation of photoelectrons | ||
: As the incoming and monochromatic X-rays (with energy E<sub>phot</sub>) impinge on and travel through the sample, they may react with electrons bound to atoms in the sample with a certain binding energy (E<sub>bind</sub>). The result is free electron inside sample with a kinetic energy (E<sub>kin</sub>=E<sub>phot</sub>-E<sub>bind</sub>) that is characteristic of the atomic level it originated from. | : As the incoming and monochromatic X-rays (with energy E<sub>phot</sub>) impinge on and travel through the sample, they may react with electrons bound to atoms in the sample with a certain binding energy (E<sub>bind</sub>). The result is free electron inside sample with a kinetic energy (E<sub>kin</sub>=E<sub>phot</sub>-E<sub>bind</sub>) that is characteristic of the atomic level it originated from. As the binding energy depends on the small energy changes in the electronic states induced by the formation of chemical bonds, the electron also carries information about the chemical state. | ||
; Transport towards the vacuum | |||
: The inelastic mean free path of the photoelectrons is very short. | |||
; Detection in the analyzer | |||
This causes all electrons undergo inelastic collisions with sample electrons and a tail of | |||
== X-ray Photoelectron Spectroscopy analysis (XPS) == | == X-ray Photoelectron Spectroscopy analysis (XPS) == | ||