Specific Process Knowledge/Characterization/XPS/XPS technique: Difference between revisions
| Line 15: | Line 15: | ||
; Generation of photoelectrons | ; Generation of photoelectrons | ||
: As the incoming and monochromatic X-rays | : As the incoming and monochromatic X-rays impinge on and travel through the sample, they may react with electrons bound to atoms in the sample with a certain binding energy (E<sub>bind</sub>) | ||
In the XPS spectrometer system the probed samples are irradiated by photons with a specific energy, and the photoelectrons that leaves the sample are detected. The energy levels of the electrons are elemental specific, and by measuring the energy of the outgoing electrons, it is possible to detect which elements that are present in a sample. | In the XPS spectrometer system the probed samples are irradiated by photons with a specific energy, and the photoelectrons that leaves the sample are detected. The energy levels of the electrons are elemental specific, and by measuring the energy of the outgoing electrons, it is possible to detect which elements that are present in a sample. | ||