Specific Process Knowledge/Characterization/XPS/XPS technique: Difference between revisions
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[[File:800px-XPS_PHYSICS.jpg|700px| frameless|link=https://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy|XPS principle. Image taken from wikipedia.]] | [[File:800px-XPS_PHYSICS.jpg|700px| frameless|link=https://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy|XPS principle. Image taken from wikipedia.]] | ||
The components of the system are: | |||
; The X-ray source | |||
: asdfasdf | |||
In the XPS spectrometer system the probed samples are irradiated by photons with a specific energy, and the photoelectrons that leaves the sample are detected. The energy levels of the electrons are elemental specific, and by measuring the energy of the outgoing electrons, it is possible to detect which elements that are present in a sample. | In the XPS spectrometer system the probed samples are irradiated by photons with a specific energy, and the photoelectrons that leaves the sample are detected. The energy levels of the electrons are elemental specific, and by measuring the energy of the outgoing electrons, it is possible to detect which elements that are present in a sample. | ||