Specific Process Knowledge/Characterization/XPS/XPS technique: Difference between revisions

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	XPS is a surface sensitive and non destructive technique used for analysis of the elemental composition. The basic principle is shown below.		XPS is a surface sensitive and non destructive technique used for analysis of the elemental composition. The basic principle is shown below.

	[[File:800px-XPS_PHYSICS.jpg\|700px\| frameless\| link=[https://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy~~\| Wikipedia].~~]]		[[File:800px-XPS_PHYSICS.jpg\|700px\| frameless\|link=https://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy]]