Specific Process Knowledge/Characterization/Element analysis: Difference between revisions
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{| border="2" cellspacing="0" cellpadding="2" align="center" | {| border="2" cellspacing="0" cellpadding="2" align="center" | ||
!width="100" style="background:silver; color:black" | | !width="100" style="background:silver; color:black" | | ||
!width="250" style="background:silver; color:black" | SEM with EDX | !width="250" style="background:silver; color:black" | SEM with [[Specific Process Knowledge/Characterization/EDX|EDX]] | ||
!width="250" style="background:silver; color:black" | [[Specific Process Knowledge/Characterization/SIMS: Secondary Ion Mass Spectrometry#Atomika_SIMS|Atomika SIMS]] | !width="250" style="background:silver; color:black" | [[Specific Process Knowledge/Characterization/SIMS: Secondary Ion Mass Spectrometry#Atomika_SIMS|Atomika SIMS]] | ||
!width="250" style="background:silver; color:black" | [[Specific Process Knowledge/Characterization/XPS|XPS]] (or ESCA) | !width="250" style="background:silver; color:black" | [[Specific Process Knowledge/Characterization/XPS|XPS]] (or ESCA) | ||