Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

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 Outside the cleanroom in the basement of building 346, the [[/Jeol|Jeol SEM]] provides a possibilty of imaging samples that do not go into the cleanroom.
-'''The user manuals, quality control procedures and results, user APVs, technical information and contact information can be found in LabManager:'''
+'''The user manuals, quality control procedures and results, user APVs, technical information and contact information can be found in LabManager:'''<br>
+SEM's at DTU Danchip:
 * [http://www.labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=37| The SEM Leo page in LabManager],
 * [http://www.labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=275| The SEM Zeiss page in LabManager],
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 * [http://www.labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=149| The SEM Jeol page in LabManager],
+SEM's at DTU-Cen:
-'''Scanning electron microscopy at DTU-Cen'''
 * [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=347| The Dual beam FEI Helios Nanolab 600 page in LabManager],
 * [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=239| The SEM FEI Nova NanoSEM 600 page in LabManager],