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Specific Process Knowledge/Lithography/EBeamLithography: Difference between revisions

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{| cellpadding="2" style="border: 2px solid darkgray;" align="right"
{| cellpadding="2" style="border: 2px solid darkgray;" align="right"
! width="150" |  
! width="200" |  
! width="150" |  
! width="200" |  
! width="150" |  
! width="200" |  
! width="250" |  
! width="200" |  
|- border="0"
|- border="0"
| [[File:mark example2.png|100px]]
| [[File:mark example2.png|100px]]
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| [[File:Chip example.png|150px]]
| [[File:Chip example.png|150px]]
|- align="center"
|- align="center"
| Definition of length and width of global mark, use L = 500-1000 µm, W 3-5 µm || Text around mark not recommended || Global mark (P and Q) positions on wafer. Positions of global marks are entered in jdf file using wafer coordinate system. || Example of chip with 4 chip marks. Position of chip marks are entered in jdf file using chip coordinate system, i.e. center of chip is (0,0).
| Definition of length and width of global mark, use L = 500-1000 µm, W 3-5 µm || Text around mark not recommended || Global mark (P and Q) positions on wafer. Positions of global marks are entered in jdf file using wafer coordinate system. || Example of chip with 4 chip marks. Always position the chip marks outside the chip pattern. Position of chip marks are entered in jdf file using chip coordinate system, i.e. center of chip is (0,0).
|}
|}