Specific Process Knowledge/Etch/ICP Metal Etcher/silicon/nano/Sinan37: Difference between revisions

From LabAdviser
Jml (talk | contribs)
Created page with "{| {{table}} | align="center" style="background:#f0f0f0;"|'''Nominal trench line width''' | align="center" style="background:#f0f0f0;"|'''''' | align="center" style="backgroun..."
 
Jmli (talk | contribs)
No edit summary
Line 1: Line 1:
<!-- revised 1/6-2015 by jmli -->
{| {{table}}
{| {{table}}
| align="center" style="background:#f0f0f0;"|'''Nominal trench line width'''
| align="center" style="background:#f0f0f0;"|'''Nominal trench line width'''

Revision as of 14:13, 1 June 2015

Nominal trench line width ' ' 30 60 90 120 150 Average Std. dev.
Etch rate nm/min 59 67 67 67 68 66 4
Sidewall angle degs 84 86 84 86 86 85 1
CD loss nm/edge -16 -31 -29 -36 -33 -29 8
CD loss foot nm/edge -16 -23 -14 -18 -12 -17 4
Bowing 7 23 15 10 9 13 7
Bottom curvature -27 -8 11 9 4 -2 15