Specific Process Knowledge/Characterization/Sample preparation: Difference between revisions

@@ Line 106: / Line 106: @@
 {| border="1" cellspacing="1" cellpadding="1" align="middle"
 ![[image:WaferWithCast_2.jpg|300x300px|thumb|left|
-  Tilt angle 20 degree. Close up. Bird View. Dark area is Silicon. Bright area is Silicon Dioxide. The Silicon Dioxide sidewall is corrugated.
+  Photograph of the temperature cured and released PDMS sample fixed to a silicon wafer ready for further inspection.
 ]]
 ![[image:Cast.jpg|300x300px|thumb|left|
-  Tilt angle 20 degree. Close up. Bird View. Dark area is Silicon. Bright area is Silicon Dioxide. The Silicon Dioxide sidewall is corrugated.
+  Close up showing the replicated features in PDMS.
 ]]
 |-