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Specific Process Knowledge/Characterization/Sample preparation: Difference between revisions

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  Tilt angle 20 degree. Close up. Bird View. Dark area is Silicon. Bright area is Silicon Dioxide. The Silicon Dioxide sidewall is corrugated.  
  Tilt angle 20 degree. Close up. Bird View. Dark area is Silicon. Bright area is Silicon Dioxide. The Silicon Dioxide sidewall is corrugated.  
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![[image:FRSTO 1umSiO2 AOE 4 Tilt20degrees C6 L9 04.jpg|300x300px|thumb|left|
![[image:Cast.jpg|300x300px|thumb|left|
  Tilt angle 20 degree. Close up. Bird View. Dark area is Silicon. Bright area is Silicon Dioxide. The Silicon Dioxide sidewall is corrugated.  
  Tilt angle 20 degree. Close up. Bird View. Dark area is Silicon. Bright area is Silicon Dioxide. The Silicon Dioxide sidewall is corrugated.  
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{| border="1" cellspacing="1" cellpadding="1" align="middle"
![[image:SEM_PDMS_4.jpg|300x300px|thumb|left|
Bird View. Dark area is Silicon. Bright area is Silicon Dioxide. The edges are nicely defined, though corrugated on the 100 nm scale.
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![[image:SEM_PDMS_5.jpg|300x300px|thumb|left|
Close up. Bird View. Dark area is Silicon. Bright area is Silicon Dioxide. Residues of the SiO2 etching are apperent on top of the SiO2, i.e. particles a few nanometers in diameter. Most probably it is sputtered and redopsited Silicon Dioxide, but not confirmed. Attempts to remove them in 7-Up or HCl failed.
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