Specific Process Knowledge/Etch/Wet Silicon Oxide Etch (BHF): Difference between revisions
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|'''Etch rate''' | |'''Etch rate''' | ||
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*~ | *Wet thermal oxide:~80nm/min | ||
*~ | *PECVD1 (standard):~147nm/min | ||
*TEOS:~265nm/min | |||
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*Wet thermal oxide:~25nm/min | |||
*PECVD1 (standard):~87nm/min | |||
*TEOS:~153nm/min | |||
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*Wet thermal oxide:~80nm/min | |||
*PECVD1 (standard):~147nm/min | |||
*TEOS:~265nm/min | |||
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|'''Selectivity R<sub>Si<sub>3</sub>N<sub>4</sub></sub> / R<sub>SiO<sub>2</sub></sub>''' | |'''Selectivity R<sub>Si<sub>3</sub>N<sub>4</sub></sub> / R<sub>SiO<sub>2</sub></sub>''' |
Revision as of 16:10, 19 February 2008
Wet Silicon Oxide Etch (BHF and SIO Etch (wetting agent))
Silicon oxide can be etched using HF. At Danchip it is mainly used in a buffered version BHF (premixed). The BHF has a more stabil etch rate and has a high selectivty of oxide compared to photoresist which makes photoresist a good masking material for the oxide etch. However etching down to a silicon surface BHF leaves the siliocn surface slightly more rough than a pure HF solution.
SIO etch (BHF with wetting agent) can also be used for etching silicon oxide. This is mainly for etching small holes (~<?)
Silicon oxide etch data
BHF | 5% HF | SIO | |
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General description |
Etching of silicon oxide with a stabil etch rate |
Mainly for removing native oxide | |
Chemical solution | BHF?? | 5% HF | BHF with wetting agent |
Process temperature | Room temperature | Room temperature | Room temperature |
Possible masking materials |
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Etch rate |
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Selectivity RSi3N4 / RSiO2 | ~21 | <21 | |
Batch size |
1-25 wafers at a time |
1-25 wafer at a time | |
Size of substrate |
2-6" wafers |
2-6" wafers | |
Allowed materials |
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