Specific Process Knowledge/Etch/Wet Silicon Oxide Etch (BHF): Difference between revisions

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|'''Etch rate'''
|'''Etch rate'''
|Wet thermal oxide:~80nm/min
PECVD1 (standard):
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*~26 Å/min (Si-rich Si<sub>3</sub>N<sub>4</sub>)
*Wet thermal oxide:~80nm/min
*~? Å/min (Thermal oxide)
*PECVD1 (standard):~147nm/min
*TEOS:~265nm/min
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*Wet thermal oxide:~25nm/min
*PECVD1 (standard):~87nm/min
*TEOS:~153nm/min
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*Wet thermal oxide:~80nm/min
*PECVD1 (standard):~147nm/min
*TEOS:~265nm/min
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|'''Selectivity R<sub>Si<sub>3</sub>N<sub>4</sub></sub> / R<sub>SiO<sub>2</sub></sub>'''
|'''Selectivity R<sub>Si<sub>3</sub>N<sub>4</sub></sub> / R<sub>SiO<sub>2</sub></sub>'''

Revision as of 16:10, 19 February 2008

Wet Silicon Oxide Etch (BHF and SIO Etch (wetting agent))

Wet Silicon Oxide Etch (BHF): positioned in cleanroom 3

Silicon oxide can be etched using HF. At Danchip it is mainly used in a buffered version BHF (premixed). The BHF has a more stabil etch rate and has a high selectivty of oxide compared to photoresist which makes photoresist a good masking material for the oxide etch. However etching down to a silicon surface BHF leaves the siliocn surface slightly more rough than a pure HF solution.

SIO etch (BHF with wetting agent) can also be used for etching silicon oxide. This is mainly for etching small holes (~<?)


Silicon oxide etch data

BHF 5% HF SIO
General description

Etching of silicon oxide with a stabil etch rate

Mainly for removing native oxide

Chemical solution BHF?? 5% HF BHF with wetting agent
Process temperature Room temperature Room temperature Room temperature
Possible masking materials
  • Photoresist
  • Silicon nitride
  • PolySi
  • Blue film
  • Photoresist (in beaker)
  • Silicon nitride (in beaker)
  • PolySi (in beaker)
  • Blue film (in beaker)
  • Photoresist
  • Silicon nitride
  • PolySi
  • Blue film
Etch rate
  • Wet thermal oxide:~80nm/min
  • PECVD1 (standard):~147nm/min
  • TEOS:~265nm/min
  • Wet thermal oxide:~25nm/min
  • PECVD1 (standard):~87nm/min
  • TEOS:~153nm/min
  • Wet thermal oxide:~80nm/min
  • PECVD1 (standard):~147nm/min
  • TEOS:~265nm/min
Selectivity RSi3N4 / RSiO2 ~21 <21
Batch size

1-25 wafers at a time

1-25 wafer at a time

Size of substrate

2-6" wafers

2-6" wafers

Allowed materials
  • Silicon
  • Silicon nitrides
  • Silicon oxides
  • Silicon
  • Silicon nitrides
  • Silicon oxides