Specific Process Knowledge/Thin Film deposition/ALD/TiO2 deposition using ALD: Difference between revisions
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Below some SEM images of anatase TiO<sub>2</sub> deposited on trenches are shown. | Below some SEM images of anatase TiO<sub>2</sub> deposited on trenches are shown. | ||
<gallery caption="Anatase TiO<sub>2</sub> deposited on a Si sample with trenches. Temperature = 120 <sup>o</sup>C, number of cycles = 500. Trench width = 200 nm, trench depth = 4 \mum, i.e. the aspect ratio is 1:20. It is seen that the TiO<sub>2</sub> covrets the trenches very well" widths=" | <gallery caption="Anatase TiO<sub>2</sub> deposited on a Si sample with trenches. Temperature = 120 <sup>o</sup>C, number of cycles = 500. Trench width = 200 nm, trench depth = 4 \mum, i.e. the aspect ratio is 1:20. It is seen that the TiO<sub>2</sub> covrets the trenches very well" widths="350px" heights="350px" perrow="5"> | ||
image: | image:SEM-TiO2-120C-1.jpg| | ||
image: | image:SEM-TiO2-120C-2.jpg| | ||
image: | image:SEM-TiO2-120C-3.jpg| | ||
</gallery> | </gallery> | ||
Below some SEM images of amorphous TiO<sub>2</sub> deposited on trenches are shown | Below some SEM images of amorphous TiO<sub>2</sub> deposited on trenches are shown | ||
<gallery caption="Amorphous TiO<sub>2</sub> deposited a Si sample with trenches. Temperature = | <gallery caption="Amorphous TiO<sub>2</sub> deposited a Si sample with trenches. Temperature = 300 <sup>o</sup>C, number of cycles = 500. Trench width = 200 nm, trench depth = 4 \mum, i.e. the aspect ratio is 1:20. It is seen that the TiO<sub>2</sub> covrets the trenches very well" widths="350px" heights="350px" perrow="5"> | ||
image: | image:TiO2 trenches-300C-1.jpg| | ||
image: | image:TiO2 trenches-300C-2.jpg| | ||
image: | image:TiO2 trenches-300C-3.jpg| | ||
</gallery> | </gallery> | ||
Evgeniy Shkondin, DTU Danchip, 2014. | Evgeniy Shkondin, DTU Danchip, 2014. | ||