Specific Process Knowledge/Lithography/Coaters: Difference between revisions
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| Line 233: | Line 233: | ||
!Comments | !Comments | ||
|- | |- | ||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|1, | |1,405 | ||
| | |2,7% | ||
| | |29/1 2015 | ||
|chasil | |chasil | ||
|with HMDS. Average of 5 wafers | |with HMDS. Average of 5 wafers | ||
| Line 246: | Line 247: | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|1, | |1,446 | ||
| | |5,5% | ||
| | |17/02 2015 | ||
|chasil | |chasil | ||
|with HMDS. Average of | |with HMDS. Average of 3 wafers | ||
|} | |} | ||