Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/Crystal Settings: Difference between revisions
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|colspan="6" style="text-align: center;" style="background: #efefef;" | '''Material parameters for calculating the tooling factor''' | |||
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!scope="row" |Material | |||
!Density | |||
!Z ratio | |||
|- | |||
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|TiO<sub>2</sub> | |||
|4.260 | |||
|0.400 | |||
|- | |||
|- | |||
|SiO<sub>2</sub> | |||
|2.648 | |||
|1.000 | |||
|- | |||
|- | |||
|Si | |||
|2.320 | |||
|0.712 | |||
|} | |||
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Revision as of 11:55, 12 December 2014
| Material parameters for calculating the tooling factor | |||||
| Material | Density | Z ratio | |||
|---|---|---|---|---|---|
| TiO2 | 4.260 | 0.400 | |||
| SiO2 | 2.648 | 1.000 | |||
| Si | 2.320 | 0.712 | |||
| Settings for Crystal thickness monitor 1 | |||||
| Date | Tooling factor: TiO2 | Tooling factor: SiO2 | Tooling factor: Si | ||
|---|---|---|---|---|---|
| 22-7-2014 | 1.573 (wafer center) | ||||
| B | B1 | B2 | B3 | ||
| C | C1 | C2 | C3 | ||
| D | D1 | D2 | D3 | ||
| Settings for Crystal thickness monitor 2 | |||||
| Date | Tooling factor: TiO2 | Tooling factor: SiO2 | Tooling factor: Si | ||
|---|---|---|---|---|---|
| A | A1 | A2 | A3 | ||
| B | B1 | B2 | B3 | ||
| C | C1 | C2 | C3 | ||
| D | D1 | D2 | D3 | ||