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Specific Process Knowledge/Lithography/UVLithography: Difference between revisions

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|-style="background:silver; color:black"
|-style="background:silver; color:black"
|'''Resist'''
|'''Resist'''
|'''Polarity'''
|width=100|'''Polarity'''
|'''Spectral sensitivity'''
|'''Manufacturer'''
|'''Manufacturer'''
|'''Comments'''
|width=200|'''Comments'''
|'''Technical reports'''
|width=100|'''Technical reports'''
|'''[[Specific_Process_Knowledge/Lithography/Coaters|Spin Coating]]'''
|'''[[Specific_Process_Knowledge/Lithography/Coaters|Spin Coating]]'''
|'''[[Specific_Process_Knowledge/Lithography/UVExposure|Exposure]]'''
|'''[[Specific_Process_Knowledge/Lithography/UVExposure|Exposure]]'''
|'''[[Specific_Process_Knowledge/Lithography/Development|Developer]]'''
|'''[[Specific_Process_Knowledge/Lithography/Development|Developer]]'''
|'''Rinse'''
|'''Rinse'''
|'''Remover'''
|width=100|'''Remover'''
|'''Process flows (in docx-format)'''
|'''Process flows (in docx-format)'''


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|'''AZ 5214E'''
|'''AZ 5214E'''
|Positive but the image can be reversed
|Positive but the image can be reversed
|310 - 420 nm
|[http://www.azem.com/en/Products/Litho-technology/Photoresists.aspx AZ Electronic Materials]
|[http://www.azem.com/en/Products/Litho-technology/Photoresists.aspx AZ Electronic Materials]
|Can be used for both positive and reverse processes with resist thickness between 1 and 4 µm.
|Can be used for both positive and reverse processes with resist thickness between 1 and 4 µm.
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|'''AZ 4562'''
|'''AZ 4562'''
|Positive
|Positive
|310 - 440 nm
|[http://www.azem.com/en/Products/Litho-technology/Photoresists.aspx AZ Electronic Materials]
|[http://www.azem.com/en/Products/Litho-technology/Photoresists.aspx AZ Electronic Materials]
|For process with resist thickness between 6 and 25 µm.  
|For process with resist thickness between 6 and 25 µm.  
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|'''AZ MiR 701'''
|'''AZ MiR 701'''
|Positive
|Positive
|310 - 445 nm
|[http://www.azem.com/en/Products/Litho-technology/Photoresists.aspx AZ Electronic Materials]
|[http://www.azem.com/en/Products/Litho-technology/Photoresists.aspx AZ Electronic Materials]
|High selectivity for dry etch.
|High selectivity for dry etch.
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|'''AZ nLOF 2020'''
|'''AZ nLOF 2020'''
|Negative
|Negative
|310 - 375 nm
|[http://www.azem.com/en/Products/Litho-technology/Photoresists.aspx AZ Electronic Materials]
|[http://www.azem.com/en/Products/Litho-technology/Photoresists.aspx AZ Electronic Materials]
|Negative sidewalls for lift-off.
|Negative sidewalls for lift-off.
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|'''SU-8'''
|'''SU-8'''
|Negative
|Negative
|350 - 400 nm
|[http://microchem.com/Prod-SU82000.htm Microchem]
|[http://microchem.com/Prod-SU82000.htm Microchem]
|
|High aspect ratio.
|[[media:SU-8_DataSheet_2005.pdf‎|SU-8_DataSheet_2005.pdf‎]], [[media:SU-8_DataSheet_2075.pdf‎|SU-8_DataSheet_2075.pdf‎]]
|[[media:SU-8_DataSheet_2005.pdf‎|SU-8_DataSheet_2005.pdf‎]], [[media:SU-8_DataSheet_2075.pdf‎|SU-8_DataSheet_2075.pdf‎]]
|[[Specific_Process_Knowledge/Lithography/Coaters#KS Spinner|KS Spinner]]
|[[Specific_Process_Knowledge/Lithography/Coaters#KS Spinner|KS Spinner]]
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|[[Specific_Process_Knowledge/Lithography/Development#SU8-Developer|mr-Dev 600 developer (PGMEA)]]
|[[Specific_Process_Knowledge/Lithography/Development#SU8-Developer|mr-Dev 600 developer (PGMEA)]]
|IPA
|IPA
|Plasma ashing can remove crosslinked SU8.
|Plasma ashing can remove crosslinked SU8
|[[media:Process_Flow_SU8_70um.docx‎|Process_Flow_SU8_70um.docx‎]]
|[[media:Process_Flow_SU8_70um.docx‎|Process_Flow_SU8_70um.docx‎]]