Specific Process Knowledge/Characterization/Element analysis: Difference between revisions
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== Depth resolution using EDX == | |||
<gallery caption="Curves that show the depth of origin of the X-rays" | |||
widths="300px" heights="300px" perrow="2"> | |||
image:SiX-rayemission.jpg|The depth profiles of X-rays emerging from bulk silicon at different high voltages. | |||
image:AuX-rayemission.jpg|The depth profiles of X-rays emerging from bulk gold at different high voltages. | |||
</gallery> | |||