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Specific Process Knowledge/Lithography/Development/Developer TMAH UV-lithography processing: Difference between revisions

Taran (talk | contribs)
Taran (talk | contribs)
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=Standard Processes=
=Standard Processes=


==AZ MiR 701 (29cps) development==
==Puddle development==
Spin coating of AZ MiR 701 (29cps) on Spin Track 1 is divided into two or three steps: HMDS priming (optional), spin coating, and soft baking. At the moment, the HMDS priming is equal to the standard priming, but this may be subject to change as our process knowledge grows. Spin coating uses dynamic dispence of 4 ml resist at 800 rpm, followed by spin-off at a thickness dependent spin speed for a thickness dependent time. The wafer is deaccelerated at 1000 rpm/s for 5 seconds before stopping. Soft baking is done at 90°C for 60s. As MiR 701 has a tendency to produce "cotton candy" on the edges, soft baking is performed in 1 mm proximity.
Spin coating of AZ MiR 701 (29cps) on Spin Track 1 is divided into two or three steps: HMDS priming (optional), spin coating, and soft baking. At the moment, the HMDS priming is equal to the standard priming, but this may be subject to change as our process knowledge grows. Spin coating uses dynamic dispence of 4 ml resist at 800 rpm, followed by spin-off at a thickness dependent spin speed for a thickness dependent time. The wafer is deaccelerated at 1000 rpm/s for 5 seconds before stopping. Soft baking is done at 90°C for 60s. As MiR 701 has a tendency to produce "cotton candy" on the edges, soft baking is performed in 1 mm proximity.


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|1.053
|1.053
|0.33%
|0.33%
|5/9 2013
|taran
|with HMDS. Average of 3 wafers
|}
==AZ nLOF 2020 development==
Spin coating of AZ nLOF 2020 on Spin Track 2 is divided into two or three steps: HMDS priming (optional), spin coating, and soft baking. At the moment, the HMDS priming is equal to the standard priming, but this may be subject to change as our process knowledge grows. Spin coating uses dynamic dispence of 4 ml resist at 1000 rpm, followed by spin-of at a thickness dependent spin speed for a thickness dependent time. The wafer is deaccelerated at 1000 rpm/s for 5 seconds before stopping. Soft baking is done
at 110°C for 60s (contact bake).
''Flow names, process parameters, and test results:''
*'''T2 nLOF 2020 1,5um no HMDS'''
*'''T2 nLOF 2020 1,5um with HMDS'''
Spin-of: 30 s at 6700 rpm.
{|border="1" cellspacing="0" cellpadding="3" style="text-align:left;"
|-
|-
|-style="background:silver; color:black"
!Substrate
!Thickness
!Uniformity (+/-)
!Test date
!Tester initials
!Comments
|-
|-
|-style="background:WhiteSmoke; color:black"
|Silicon with native oxide
|1.483
|0.48%
|5/9 2013
|5/9 2013
|taran
|taran
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*'''T2 5214E image reversal bake'''
*'''T2 5214E image reversal bake'''
Process parameters: 100s contact bake at 110°C.
Process parameters: 100s contact bake at 110°C.
==Combined PEB and development==