Specific Process Knowledge/Doping: Difference between revisions

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![[Specific Process Knowledge/Thin film deposition/Furnace LPCVD Nitride|Method 1]]
![[Specific_Process_Knowledge/Thermal_Process/A4_Phosphor_Pre-dep_furnace|Phosphor predep]]
![[Specific Process Knowledge/Thin film deposition/PECVD|Method 2]]
![[Specific_Process_Knowledge/Thermal_Process/A1_Bor_Drive-in_furnace|Boron predep]]
![[Specific Process Knowledge/Thin_film_deposition/Furnace_LPCVD_PolySilicon|Doped Poly Si]]
![[Specific Process Knowledge/Thin_film_deposition/PECVD|PECVD doped thin film]]
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!Generel description
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|Generel description - method 1
|Dopants introduced by Diffusion from gas-phase (POCL)
|Generel description - method 2
|Dopants introduced by Diffusion from solid source wafers
|Dopants introduced by in-situ doping of poly/amorphous Si
|Deposition of doped thin film (doped oxides or nitrides)
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*A
*A

Revision as of 13:04, 6 October 2014

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Doping your wafer

This page is about doping your wafer or making a thin film layer doped with boron, phosphor or Germane.



Comparison method 1 and method 2 for the process

Phosphor predep Boron predep Doped Poly Si PECVD doped thin film
Generel description Dopants introduced by Diffusion from gas-phase (POCL) Dopants introduced by Diffusion from solid source wafers Dopants introduced by in-situ doping of poly/amorphous Si Deposition of doped thin film (doped oxides or nitrides)
Parameter 1
  • A
  • B
  • A
  • B
  • A
  • B
  • A
  • B
Parameter 2
  • A
  • B
  • C
  • A
Substrate size
  • # small samples
  • # 50 mm wafers
  • # 100 mm wafers
  • # 150 mm wafers
  • # small samples
  • # 50 mm wafers
  • # 100 mm wafers
  • # 150 mm wafers
Allowed materials
  • Allowed material 1
  • Allowed material 2
  • Allowed material 1
  • Allowed material 2
  • Allowed material 3



Ion implantation

Cannot be done at Danchip. We recommend ...