Specific Process Knowledge/Thin film deposition/Furnace LPCVD PolySilicon: Difference between revisions
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Ikke skrevet! | |||
==LPCVD (Low Pressure Chemical Vapor Deposition) PolySilicon== | |||
[[Image:A4_Furnace_PolySi.jpg|300x300px|thumb|A4 Furnace PolySilicon: positioned in cleanroom 2]] | [[Image:A4_Furnace_PolySi.jpg|300x300px|thumb|A4 Furnace PolySilicon: positioned in cleanroom 2]] | ||
At the moment there is one furnace for PolySilicon depositions at Danchip. The furnace is a Tempress horizontal furnace. The process is a batch process meaning you can run a batch of 25 wafers at a time. The deposition takes place at temperatures of 800-835 degrees Celsius. The reactive gases are Ammonia and dichlorsilane. The LPCVD nitride has a good step coverage and the film thickness is very uniform over the wafer. We have two standard LPCVD nitride processes: One for depositing stoichiometric nitride (Si<sub>3</sub>N<sub>4</sub>) and one for deposition of low stress nitride (SNR). To get information on how to operate the furnace please read the manual which is uploaded to LabManager. | |||
==Process Knowledge== | |||
Please take a look at the process side for deposition of Silicon Nitride using LPCVD: | |||
[[Specific Process Knowledge/Thin film deposition/Deposition of Silicon Nitride/Deposition of Silicon Nitride using LPCVD|Deposition of Silicon Nitride using LPCVD]] | |||
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==A rough overview of the performance of LPCVD Silicon Nitride and some process related parameters== | |||
{| border="2" cellspacing="0" cellpadding="10" | |||
|- | |||
!style="background:silver; color:black;" align="left"|Purpose | |||
|style="background:LightGrey; color:black"|Deposition of silicon nitride ||style="background:WhiteSmoke; color:black"|Stoichiometry: | |||
*Si<sub>3</sub>N<sub>4</sub> | |||
*SRN | |||
SRN: Silicon Rich Nitride | |||
|- | |||
!style="background:silver; color:black" align="left"|Performance | |||
|style="background:LightGrey; color:black"|Film thickness||style="background:WhiteSmoke; color:black"| | |||
*Si<sub>3</sub>N<sub>4</sub>:~50Å - ~3000Å | |||
*SRN: ~50Å - ~10000Å | |||
|- | |||
|style="background:silver; color:black"|.||style="background:LightGrey; color:black"|Step coverage | |||
|style="background:WhiteSmoke; color:black"| | |||
*Good | |||
|- | |||
|style="background:silver; color:black"|.||style="background:LightGrey; color:black"|Film quality | |||
|style="background:WhiteSmoke; color:black"| | |||
*Dense film | |||
*Few defects | |||
|- | |||
!style="background:silver; color:black" align="left"|Process parameter range | |||
|style="background:LightGrey; color:black"|Process Temperature | |||
|style="background:WhiteSmoke; color:black"| | |||
*800-835 <sup>o</sup>C | |||
|- | |||
|style="background:silver; color:black"|.||style="background:LightGrey; color:black"|Process pressure | |||
|style="background:WhiteSmoke; color:black"| | |||
*80-230 mTorr | |||
|- | |||
|style="background:silver; color:black"|.||style="background:LightGrey; color:black"|Gas flows | |||
|style="background:WhiteSmoke; color:black"| | |||
*SiH<math>_2</math>Cl<math>_2</math>:10-100 sccm | |||
*NH<math>_3</math>:10-75 sccm | |||
|- | |||
!style="background:silver; color:black" align="left"|Substrates | |||
|style="background:LightGrey; color:black"|Batch size | |||
|style="background:WhiteSmoke; color:black"| | |||
*1-25 4" wafer per run | |||
*Deposition on both sides of the substrate | |||
|- | |||
|style="background:silver; color:black"|.|| style="background:LightGrey; color:black"|Substrate material allowed | |||
|style="background:WhiteSmoke; color:black"| | |||
*Silicon wafers (new from the box or RCA cleaned) | |||
**with layers of silicon oxide or silicon (oxy)nitride (RCA cleaned) | |||
*Quartz wafers (RCA cleaned) | |||
|- | |||
|} |
Revision as of 15:20, 28 January 2008
Ikke skrevet!
LPCVD (Low Pressure Chemical Vapor Deposition) PolySilicon
At the moment there is one furnace for PolySilicon depositions at Danchip. The furnace is a Tempress horizontal furnace. The process is a batch process meaning you can run a batch of 25 wafers at a time. The deposition takes place at temperatures of 800-835 degrees Celsius. The reactive gases are Ammonia and dichlorsilane. The LPCVD nitride has a good step coverage and the film thickness is very uniform over the wafer. We have two standard LPCVD nitride processes: One for depositing stoichiometric nitride (Si3N4) and one for deposition of low stress nitride (SNR). To get information on how to operate the furnace please read the manual which is uploaded to LabManager.
Process Knowledge
Please take a look at the process side for deposition of Silicon Nitride using LPCVD:
Deposition of Silicon Nitride using LPCVD
Purpose | Deposition of silicon nitride | Stoichiometry:
SRN: Silicon Rich Nitride |
---|---|---|
Performance | Film thickness |
|
. | Step coverage |
|
. | Film quality |
|
Process parameter range | Process Temperature |
|
. | Process pressure |
|
. | Gas flows |
|
Substrates | Batch size |
|
. | Substrate material allowed |
|