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Specific Process Knowledge/Characterization/Element analysis: Difference between revisions

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| Technique
| Technique
| Non destructive excitation of X-rays in the sample. The elemental analysis is possible because the energy of these photons is characteristic of the element they emitted from.
| Non destructive excitation of X-rays in the sample.  
  The elemental analysis is possible because the energy of  
  these photons is characteristic of the element they emitted from.
| Destructive method that sputters off surface atoms with heavy ions.   
| Destructive method that sputters off surface atoms with heavy ions.   
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